Analyzing Nanoscale Particles
Dr. Raj Dave directs the New Jersey Center for Engineered Particulates which has opened a new facility for characterizing nano and submicron particles.
A new facility capable of characterizing particles at the nano and submicron level will support NJIT's research in advanced materials including engineered particulates, nano particles and nano-composites, carbon nano-tubes, nano devices, microelectronics, MEMS, opto-electronic, superconductors, bio-minerals, and bio-materials. With major funding from the National Science Foundation and New Jersey Commission on Higher Education, the New Jersey Center for Engineered Particulates (NJCEP), directed by Rajesh Davé, professor of mechanical engineering, has established a state-of-the-art Electron Microscopy facility. The center, furnished with equipment valued at over $2 million, allows for nanoscale analysis and x-ray spectroscopy with an in-column energy filtering Transmission Electron Microscope (TEM) (photo right), Field Emission Scanning Electron Microscope (FESEM), and a whole suite of sample preparation devices. The unusual combination of TEM and FESEM instrumentation supports sophisticated materials research, including the tailored particulate materials designed by the New Jersey Center for Engineered Particulates with unique properties for many potential applications in a variety of industries including pharmaceuticals, food, cosmetics, ceramics, electronics and specialty chemicals.